Institut des
NanoSciences de Paris
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Accueil > Equipements > Salle blanche > Equipement de la salle > Caracterization Equipment
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Caracterization Equipments

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  • Scanning electron microscope (Zeiss Supra 40)
    This system allows the observation at big scale (up to the nanometer scale) of samples. Available detectors : SE2 and SE IN-LENS.
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  • Optical microscope (Olympus BX51)
    Interchangeable objectives microscope (x5, x10, x20, x50 and x100). Various solutions offered to illuminate the sample and possibility of working under crossed polarizers.
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  • Mechanical profilometer (Dektak 150 Veeco)
    Allows to measure exactly walking(steps), average roughness or still to realize a 3D map of the surface of a sample. Two styli(stylets) of measure are available (2,5 µm and 12,5 µm of radius of curvature of the point(headland)).